When: 2010-09-20 to 2010-09-23
Country/City: France, Toulouse
Venue: Pierre Baudis Convention Center
Related Industries: Industrial Goods trade show
Description:
The SPIE Remote Sensing Symposium has become the largest and most prestigious annual international meeting on this subject in Europe with more than 600 attendees and each year sees comprehensive coverage of scientific topics, applications, sensors, systems, and satellite platforms and more than 25 countries are represented. This event will provide an excellent opportunity to explore new opportunities to collaborate with new partners from other related fields of activity.
For Visitor:
Professionals related to the field of sensor technologies, measuring components, automotive & aerospace engineering, material & quality testing, customised measuring & testing systems are the target attendees.
Exhibit profile:
Profile for exhibit includes UV, VIS and IR cameras and imaging systems, Lidar, Ladar, Database management, Multi- and hyperspectral imaging, Adaptive optics, MEMS, Image and signal processing.
